| Naoi, Yoshiki (41.3%) / Professor [Detail] |
 |
| Academic Degree: |
博士(工学) |
| Field of Study: |
半導体光デバイス, 光工学 |
| Lecture: |
オリエンテーション1年 (Bachelor Course), Photonic Device Fabrication (Graduate School), Presentation Method (D) (Graduate School), Advanced Optoelectronic Devices (Graduate School), Photonic Semiconductor Device Physics (Graduate School), Interdisciplinary Seminar in Science and Technology (Graduate School), Research Approaches in Science and Technology D (Graduate School), Solid State Physics (Bachelor Course), Electromagnetic Theory 1 and Exercise (Bachelor Course), Electromagnetic Theory 2 and Exercise (Bachelor Course), Graduate Research on Electrical and Electronic Engineering (Graduate School), Electrical and Electronic Engineering Design Laboratory (Bachelor Course) |
| Subject of Study: |
半導体結晶成長と光デバイス開発 (窒化物, ワイドギャップ半導体, optical device, 薄膜·結晶成長, 物性評価) |
|
| Nishino, Katsushi (22.5%) / Associate Professor [Detail] |
 |
| Academic Degree: |
博士(工学) |
| Field of Study: |
Semiconductor Physical Electronics |
| Lecture: |
Presentation Method (D) (Graduate School), Photonic Devices (Bachelor Course), Photonic Semiconductor Device Physics (Graduate School), Semiconductor Physics (Bachelor Course), Advanced Theory of Semiconductors (Graduate School), Graduation Work (Bachelor Course), Interdisciplinary Seminar in Science and Technology (Graduate School), Quantum Mechanics for Semiconductor Physics (Bachelor Course), Reading Scientific Papers (Bachelor Course), Electromagnetic Theory 2 and Exercise (Bachelor Course), Graduate Research on Electrical and Electronic Engineering (Graduate School), Electrical and Electronic Engineering Elementary Laboratory (Bachelor Course), Special Lectures on Electrical and Electronic Engineering (Bachelor Course) |
| Subject of Study: |
AlN等窒化物半導体の結晶成長，物性評価，デバイス応用 (AlN, バルク結晶成長, 物性評価) |
|
| (Fukui, Masuo) (2.3%) / Professor Emeritus [Detail] |
 |
| Academic Degree: |
工学博士 |
| Field of Study: |
光物性, 光計測, 光電子工学 |
| Subject of Study: |
球と光の相互作用, フォトニック結晶を用いた光デバイス開発, 非線形光学効果に基づく光デバイス開発, ナノスケール領域観測用の光計測装置開発, 表面電磁波の物性 (微小球, フォトニック結晶, 非線形光学効果, 近接場光学, 光熱分光法, 表面ポラリトン) |
|
| (Iritani, Tadamitsu) (0.5%) / Professor Emeritus [Detail] |
 |
| Academic Degree: |
工学博士 |
| Field of Study: |
Communication Engineering, 計測工学 |
| Subject of Study: |
高速切り替え周波数シンセサイザに関する研究, 周波数ホッピングスペクトル拡散通信方式に関する研究, ITS(高度交通システム)の車々間通信を用いた交通事故防止の研究, 定在波を用いたレーダセンサ, 生体インピーダンス計測と医療診断応用に関する研究 (シンセサイザ, FHSS, ITS, 車々間通信, 定在波, 距離センサ, 生体インピーダンス) |
|
| Kusaka, Kazuya (0.3%) / Associate Professor [Detail] |
 |
| Academic Degree: |
博士(工学) |
| Field of Study: |
X-ray Stress Measurement |
| Lecture: |
MONODZUKURI (Common Curriculum), Introduction to Innovation Project (Common Curriculum), Practice of Innovation Project (Common Curriculum), オリエンテーション3年 (Bachelor Course), Project Management Fundamentals (Bachelor Course), Technical English Fundamentals 2 (Bachelor Course), Mechanical Measurement 1 (Bachelor Course), Machine Design 1 (Bachelor Course), Nondestructive Metrology (Graduate School) |
| Subject of Study: |
Residual stress measurement in nitride semiconductor films by using X-ray diffraction (residual stress, X-ray diffraction, sputtering, nitride semiconductor films) |
|
| (Hanabusa, Takao) (0.3%) / Professor Emeritus [Detail] |
 |
| Academic Degree: |
工学博士(大阪大学) |
| Field of Study: |
Mechanical Engineering |
| Subject of Study: |
X線材料強度学 (X-ray stress measurement, residual stress, Dimensional instability, Surface modification, Stress in thin films) |
|
| Okada, Tatsuya (0.3%) / Professor [Detail] |
 |
| Academic Degree: |
Ph.D. |
| Field of Study: |
texture control, Crystallographic Defect |
| Lecture: |
STEM Practice (Bachelor Course), オリエンテーション3年 (Bachelor Course), Presentation Method (D) (Graduate School), Technical English Fundamentals 1 (Bachelor Course), Technical English Fundamentals 2 (Bachelor Course), Engineering Materials 1 (Bachelor Course), Mechanical Properties of Materials (Graduate School), Controlling Physical Properties of Crystalline Materials (Graduate School) |
| Subject of Study: |
SEM/EBSD analysis of deformed and recrystallized microstructures in pure metals (texture control, recrystallization, crystal plasticity, single crystal, bicrystal, tricrystal, SEM/EBSD), TEM observation of crystallographic defects in semiconductors (SiC, crystallographic defect, epitaxial film, transmission electron microscopy, diamond) |
|