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Academic Degree: |
博士(工学) |
Field of Study: |
Electronic Circuit Engineering |
Subject of Study: |
Current Test of CMOS Circuits and Test Circuit Design, Design and Test of Computers, Defect-Based Tests of CMOS Circuits, Mixed Signal Tests, Electrical Test of Logic Circuits on PCBs (Current Test, Design for Testability, Memory Test, Analog Test, Logic Circuit, Lead Open Test) |
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